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I am an expert in AEM. The application of x-ray microanalysis in TEM and STEM. I take note of the absence of any discussion of SAD, and would add a need for CBED! This page, although very good, is incomplete. Perhaps it needs expansion? Graham Cliff.

[edit] ==

I'm certainly NOT an expert here. My content comes directly from the Nobelprze.org website. If they have it wrong, please fix it. IMHO something needs to be said about the STM as a type of electron microsope, perhaps, as suggested below fewer paragraphs, with a link to its own page. frankatca 13 Nov. 2005 The heretic Harold Hillman claims that electron microscopy on cell material is a big methodological mistake. Frank A

Heretic? This is science, not religion. Hillman's claims don't explain why differing techniques should produce such similar results. He's not a heretic, just wrong. Average Earthman 16:51, 28 Feb 2004 (UTC)

[edit] Tunneling microscope as Electron microscope

Should this page not include the Scanning Tunneling Microscope under types as well? It is after all using electrons to image.

I've heard of scanning tunneling electron microscopes before. what are they? - Omegatron 01:58, Feb 4, 2005 (UTC)

• • Better known as the Scanning tunneling microscope. In microscope, the acronym STEM usually refers to the Scanning transmission electron microscope. Average Earthman 10:09, 4 Feb 2005 (UTC)

Shorter wavelengths do not help with magnification, as this article states. They help with resolving power.

Against: When I think electron microscope, I see an electron gun or some sort of electron beam as an analog to optical microscopes... Tunneling microscopes are a different beast entirely, because the electrons are extracted form the sample. I used to work with an STM, but now I do biology. An STM would rip a biological sample apart, but electron microscopes are very popular.

I say we should remove the bulk tunneling microscopes info and only make a refence to them. Either way we don't need 4 paragraphs, when there is feature page. --vossman 21:35, 13 November 2005 (UTC)

I disagree.

[edit] Merge of selected area diffraction

It's a technique specific to transmission electron microscopy, and therefore any merging should be with Transmission electron microscopy. Average Earthman 13:41, 28 January 2006 (UTC)

I second Average Earthman's vote - SA diffraction belongs in the TEM article. MarcoTolo 03:57, 5 February 2006 (UTC)

Not sure I agree, but I rather expanded the SAD article to make this a more useful discussion. Please edit the SAD article, in case I missed something or defiled the English language. Cm the p 19:22, 6 March 2006 (UTC)

Oppose. I think the microscope page should talk about a microscope and technique should get allocated to separate pages. Especially now that Cm the p has expanded the article. --vossman 22:16, 6 March 2006 (UTC)

I should say I wasn't actually voting *for* a merge, merely stating where the merge should be if one was carried out. Average Earthman 22:27, 6 March 2006 (UTC)

Well, we could consider if the SAD article should be merged with the electron diffraction article instead... O. Prytz 22:39, 7 June 2006 (UTC)

Oppose. Surely any merge should occur in the other direction. SAD is simply something which relates to electron microscopes...mpearse 09:39, 20 September 2006 (UTC)

I have removed the suggestion that that selected area diffraction be merged with this article, and suggest instead that it be merged with Transmission electron microscopy. See the SAD talk page. O. Prytz 23:08, 7 October 2006 (UTC)

[edit] Test moved from Microscope

The following text was in the article Microscope but probably is better fitted here but I do not have the knowledge to ensure that it is well integrated. Apologies for the wholesale dump. Please feel free to delete from this discussion page folliowing any integration that may be appropriate. Velela 20:29, 22 April 2006 (UTC)

Types and classification of microscopes

Foremost due to importance in todays technology to observe micro-pico scale structure and processes a vastness of microscope designs and implementations, improvement exists all of which are usually employed as soon as the first functional prototype is available. Thus using acronyms as abbreviations makes only sense in a context where it is clear which microscope is referred to otherwise, especially the three letter acronyms are ambiguous.

The classification of a microscope is based upon its underlying fundamental field of interest e.g. magnetic field, electric field or electromagnetic field. Intrinsically it is not yet possible to probe by other fundamental forces such as gravitation or the strong/weak nuclear force. In fact the fundamental forces except electromagnetism are heavily disputed, and some unified theories state the existence of only one fundamental force: electromagnetism^[1].

It may be possible in the future to probe for subatomic particles, as our understanding of fundamental physical principles progresses. So far the uncertainty principle (HUP) can seemingly be violated in the frequency/energy-time uncertainty relation when there is a priori knowledge about the class of parameterized functions used [11]. However the uncertainty principle cannot be overcome in an "underparameterized" system, which in this case holds true so far for any quantum system, thus limiting further progress "until we can define the nature of the atom enough to complete the grand unification theory(GUT) and fully explain quantum mechanics in mathematical terms"[10]. Moreover it takes time to realize the potential of certain technological advancements like bose einstein condensates(BEC) (e.g. the full potential of the LASER was in it's early days unkown, and represents now in the 21st century one of the most important technologies spanning over all natural sciences).

[edit] Magnetic field based

[edit] Technology

The High-Voltage Electron Microscope (HVEM) from Berkley Labs, currently being dismantled in order to be replaced by a TEAM microscope. It featured a 1.5 MeV beam, the highest in the US.

A Scanning Superconducting Quantum Interference Device Microscope to generate a magnetic map of the surface atoms

• Sensor: Low temperature superconducting quantum interference

device (SQUID); state of the art as of 2000 are 6nm Semiconductor SQUIDs; story

• Spatial resolution: 1 µm for single dipole sources
• Commercially available:Yes (Tristan Technologies, IBM,...)

[edit] Introduction

A Scanning Magnetic Flux Microscope is a device that can map magnetic fields with a spatial resolution in the micron range. The detector uses a superconducting quantum interference device to sense tiny magnetic fields from a sample which moves back and forth beneath the SQUID in steps according to the resolution of the device. The scientific uses of the magnetic force microscope include prospecting for the characteristic fields emanating from microscopic nuggets of superconductor buried inside otherwise non-superconducting samples. The microscope can also be used to image poorly-magnetic materials such as thin copper patterns on printed circuit boards by measuring the faint magnetic fields that arise from eddy currents induced in the copper or other materials.(R.C. Black et al., 3 January 1994, Applied Physics Letters.)

[edit] Application

• micro-current distributions
• vortex motion in superconductors
• traces on a circuit board ormulti-chip module
• weak electric currents in semiconductors
• integrated circuits
• magnetic domains
• transient magnetic properties
• magnetic susceptibility
• magnetic hysteresis

[edit] Types/Names

• Magnetic force microscope/Magnetic field microscope (MFM)
• Ultra High Resolution Scanning SQUID Microscope (UHRSSM)
• Scanning Magnetic Flux Microscope
• Scanning SQUID microscope
• Nuclear Magnetic Resonance Microscope (NMRM) / MRM
• Magnetic resonance force microscope (MRFM)
• Combined Optical Magnetic Resonance Microscope

[edit] Scanning probe microscope

In scanning probe microscopy (SPM), a physical probe is used either in close contact to the sample or nearly touching it. By rastering the probe across the sample, and by measuring the interactions between the sharp tip of the probe and the sample, a micrograph is generated. The exact nature of the interactions between the probe and the determines exactly what kind of SPM is being used. Because this kind of microscopy relies on the interactions between the tip and the sample, it generally only measures information about the surface of the sample.

Some kinds of SPMs are:

• Atomic force microscope
• Scanning tunneling microscope
• Electronic Force Microscopy
• Magnetic force microscope

[edit] Articles/Information

• There is a concise article by Dr. Huey differentiation the use and application of various Atomic force microscopes available here.

[edit] Electromagnetic field based

For the classification according to the wavelength, see electromagnetic spectrum.

Further classification could be made by pulsation and duration of Laser light, wavelength/energy, linearity/non-linearity, and foremost whether or not vital microscopy can be carried out.

[edit] Atom beam

A Dual column SEM/FIB. The system shown is a FEI Nova 200 NanoLab: 1nm optical resolution, 10nm manipulator machining/fabrication resolution. State of the Art (2006) is 1nm manipulation with another key-technology[1]

• Atom beam microscope: generic term in analogy to electron (beam) microscope. Next generation nanoscopes featuring subnanometer wavelengths and with intert/uncharged beam entirely non-destructive and non-invasive in-situ studies.

• Scanning Helium Microscope (SHeM)
• Scanning Helium Ion Microscope: next-gen microscope, high-res microscopy,low-energy sec. e-beam, high source brightness,shorter wavelength
• Focused ion beam microscopy(FIB)
• Dual-column ion/electron beam systems, Dual column SEM/FIB: combines ultra-high resolution field emission scanning electron microscopy (SEM) and focused ion beam (FIB) etch and deposition for nanoscale prototyping, machining, 2-D and 3-D characterization, and analysis.

See also:

• Helium atom scattering (HAS-detail)
• Low energy electron diffraction (LEED-detail)
• [1] Nanoscale prototyping at 1nm, with importance of polymer cross-links (~1 nanometer) and chemical bonds (~0.2 nanometers): "Molecular scale resolution achieved in polymer nanoimprinting technique"

[edit] Electron beam

A 3D-Electron microscopy/tomography showing a zeolite crystal in its atomic configuration. Courtesy of Utrecht University

• Electron microscope
• Cryo-electron microscopy
• Energy filtered transmission electron microscopy(EF-TEM): Image is formed using only electrons that have suffered an energy loss characteristic of the element of interest
• High Resolution Transmission Electron Microscopy(HR-TEM): Provide structural information at better than 0.2 nm spatial resolution
• PEEM (photoemission electron microscope)
• SEM Scanning electron microscope
• SCEM Scanning Confocal Electron Microscope
• TEACM Transmission Electron Aberration-corrected Microscope or ACTEM
• TEM Transmission electron microscopy: when used in contrast to STEM, TEM often means Tunneling Electron Microscope
• STEM Scanning transmission electron microscopy: can also refer to Scanning Transmission Electron Module
• Scanning transmission electron microscope with an X-ray energy dispersive spectrometer (STEM-XEDS)
• (Quantitative) Environmental Cell - Transmission Electron Microscopy QEC-TEM / EC-TEM
• 3DEM 3D-Electron microscopy, electron tomography
• LVSEM: Low Voltage Scanning Electron Microscopy
• TEAM Transmission Electron Aberration-corrected Microscope (article1)
• Intermediate Voltage Electron Microscope IVEM /IVSEM
• ESEM: Environmental Scanning Electron Microscopy: a form of electron microscopy that can be carried out under atmospheres rather than vacuum: more information can be extracted from www.danilatos.com
• STXM / SXTM Scanning Transmission X-ray Microscopy: synchrotron-based soft X-ray transmission Microscope
• Cryo scanning transmission X-ray microscope
• Laser plasma-based soft x-ray microscopy LPXM: x-ray imaging with the quality of synchrotron-based microscopes

see also:

• • Wavelet-based image restoration of compact X-ray microscope images
  • Design of LPXM
  • http://www.edpsciences.org/articles/jp4/abs/2003/02/jp4pr2p121/jp4pr2p121.html Liquid jet laser-plasma source

[edit] Deep ultraviolet (230 nm to 350nm)

• Deep Ultraviolet microscope: Research stage; DUV light does not transmit through ordinary glass, and hence cannot be observed with standard microscope optics.
• Ultraviolet microscopy: Research stage; Microscopes with a UV source for excitation of fluorophores are usually not referred to as UV microscopes

[edit] Infrared

• Infrared microscope
• Infrared Near-Field Microscopy / IR-NSOM
• Thermal emission microscopy / Infrared emission microscopy: measures the spatial distribution of temperature in a sample; non-contact optical microscopy technique collecting mid-infrared photons emitted by the sample

[edit] Visible light (380 to 780 nm)

[edit] Continuous light

• Brightfield microscope
• Darkfield microscope
• Polarized Light Microscopy
• Stereomicroscope
• Ultramicroscope
• Inverted microscope
• Cathodoluminescence microscope
• DIC microscope (differential interference contrast)
• Hoffman Modulation Contrast Microscope
• Phase contrast microscope, see Frits Zernike
• Adaptive Scanning Optical Microscope (ASOM): Sucessor of SOMS *Scanning Optical Mosaic Scope (SOMS): large-field-of-view optical microscope using scanning mirrors
• Spinning disk confocal microscope (SDCM): article links to brochures

[edit] Fluorescence

• Fluorescence microscope: Classic fluorescence microscope with continuous UV emitter
• Fluorescence speckle microscopy

[edit] Phosphorescence

• Phosphorescence Microscope: Various techniques exist to acquire phosphorescence data for specific studies

[edit] Discrete/Coherent light

• Two-photon excitation microscopy
• Photonic force microscope
• Two-Beam Interferometry microscope
• Multi-Beam Interferometry microscope
• Reflection confocal microscopy
• Backscatter-enhanced reflection confocal microscopy
• Confocal laser scanning microscopy / LSCM (Laser Scanning Confocal Microscopy)
• 4Pi microscopy
• 4Pi STED microscopy
• CARS microscopy
• NSOM / SNOM Near field scanning optical microscopy
• TENOM Tip enhanced nonlinear optical microscopy
• Multifocal Multiphoton Microscopy (MMM)
• STED microscopy
• I²M: interference illumination microscopy
• I³M: incoherent interference illumination microscopy
• I5M: The two techniques,I²M to further sharpen the pattern and I³M can be used together as I5M
• 4Pi-I5M: The result with both 4Pi and I5M is 7-fold improvement in resolution in the z axis, providing better axial than lateral resolution (Hell and Stelzer, 1992; Gustafsson et al., 1999; Egner et al., 2002).
• SSIM (Saturated structured illumination microscopy)
• PLAP Pulsed Laser Atom Probe microscope

[edit] Fluorescence

• Epiflourescence microscopy
• Total internal reflection fluorescence microscope
• Fluorescence recovering after photobleaching (FRAP) microscope
• Fluorescence resonance energy transfer (FRET) microscope

[edit] Radio frequency

• Scanning Near-Field RF Microscopy (RF-NSOM)
• Scanning radar microscope: a radar configuration for microscale meteorological research

[edit] Microwave

• Scanning Near-Field Microwave Microscopy (MW-NSOM/SNMM)

Simple schematic

Notice: Although those microscopes rely upon Masers, the term (e.g. maser microscope) is not used. Therefore use 'coherent microwave' instead.

[edit] X-Ray

• X-ray microscope
• Soft x-ray microscopy
• [X-Ray Absorption Fine Structure] (XAFS) Microscope
• Extended X-ray Absorption Fine Structure (EXAFS)
• Near Edge X-ray Absorption Fine Structure (NEXAFS) microscopy:used to distinguish a variety of polymer species
• Quick Extended X-ray Absorption Fine Structure (QEXAFS)
• x-ray free electron laser (XFEL) microscopy (see also FEL)
• 3D x-ray microscopy / High resolution 3-D x-ray microscopy
• 2D x-ray fluorescence microscopy
• Vacuum Ultraviolet Free-Electron Laser (VUV-FEL) at DESY

[edit] See also

• ANKA is the synchrotron light source of the Forschungszentrum Karlsruhe, providing light from hard X-rays to the far-infrared for research and technology.

[edit] Gamma ray (wavelength >=1pm)

• Gamma ray microscope: So far a hypothetical microscope invented by Heisenberg

[edit] Other / microanalysis

• Ultrasound backscatter microscope (UBM)
• http://www.asu.edu/clas/csss/chrem/techniques/EDX.html Energy Dispersive X-ray Microanalysis (EDX)
• Spectroscopic / Diffraction Microanalysis:
  • Electron Energy Loss Spectroscopy (EELS)
  • Selected Area Electron Diffraction (SAED): used amongst others in TEMs for phase identification
  • STEM X-ray Microanalysis: See STEM
• CBED: Convergent-beam electron diffraction: essential method for the analysis of crystalline materials at the nanometer level
• Nanodiffraction:special form of CBED
• EELS: Electron Energy Loss Spectroscopy
• PEELS: [http://www.asu.edu/clas/csss/chrem/techniques/EELS.html Parallel electron energy-loss spectrometer

]

• Electron Holography
• Lorentz Imaging

[edit] Generic

• Digital microscope e.g. MIC-D
• Nuclear microscopy
• Virtual microscope: Any educational/training related project with the objective to emulate a certain microscope
• TPM: TelePresence Microscopy: allows remote viewing and operation using Network protocols
• Lorentz microscopy

[edit] Common Classifications

• HREM: High Resolution Electron Microscopy
• SPM: Scanning Probe Microscope
• EF:Energy Filtered Imaging
• ECM: Environmental Cell Microscopy

[edit] See also

• Angular resolution
• Microscope image processing
• Microscope slide
• Microscopy
• Microscopy laboratory in: A Study Guide to the Science of Botany at Wikibooks
• Telescope
• Common acronyms in microscopy
• Condensed Matter Physics
• Diffusion
• Low Temperature
• Luminsecence
• Molecular Orientation
• Nanoscale Plasma
• Nanoscience
• Nanotechnology
• Nanotribology
• Single molecule fluorescence
• Spectroscopy
• Surface science

[edit] References

• Max Planck Research Group
• Nanotube helium sensors could bring atom beam microscope
• [F1]:"Phase-coherent amplification of atomic matter waves" (Nature 1999/12, S. INOUYE, T. PFAU, S. GUPTA, A. P. CHIKKATUR, A. GÖRLITZ, D. E. PRITCHARD & W. KETTERLE )
• D.A. MacLaren, H. T. Goldrein, B. Holst and W. Allison, Phase-stepping optical profilometry of atom mirrors, J. Phys. D., 36, 1842-1849, 2003
• D. A. MacLaren, B. Holst, D. Riley and W. Allison, Focusing elements and design considerations for a scanning helium microscope (SHeM), SurfaceReview and Letters, 10, 249-255, 2003
• Why use a Stem and not a Tem?

[edit] External links

• Directory of Microscopy & Microanalysis Meetings/ShortCourses/Conferences 2006
• A virtual polarization microscope (requires Java)